Semiconductor Low Frequency Noise and Parameter Analyzer

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Name

Semiconductor Low Frequency Noise and Parameter Analyzer

Manufacturer

Primarius

Model

FS-Pro

Hardware Specifications

DC IV

- Bias range ±200 V / 1 A, 4 quadrants operation

- Minimum current accuracy 30 fA, voltage accuracy 30 uV

- Maximum output power 20 W

CV

- Build-in CV: DC bias range   ±200 V, maximum bandwidth 10 kHz, measurement range 20 fF~1 mF

- External LCR: DC bias range ±40 V, maximum bandwidth 20 Hz~10 MHz, measurement range 10 fF~10 mF

Pulse IV

- Bias range ±200 V / 3 A, maximum output power 480 W

- Minimum current measurement accuracy 5 pA

- Voltage measurement accuracy 30 uV, minimum pulse width 50 us

Transient I V

- Arbitrary waveform output

- Maximum sample rate 1.8 MS/s, minimum time step 10 us

1/f Noise

- Standard 100 kHz bandwidth, supporting RTN

- Minimum frequency resolution 1 mHz, measuring down to 2e-28A2 /Hz and <10 s/bias

- DUT minimum impedance: 500 Ω

High precision & fast waveform generation/measurement kit

- 2-channel, SMA interface

- Fast IV test: ± 10 V voltage, maximum current 10 mA

- SMU direct connection: Voltage input ± 25 V, maximum current 100 mA

- Sampling rate 100 msa/s, minimum recommended pulse width 130 nS

Applications

Ø  Opto-electronic device and MEMS measurement

Ø  Advanced materials and device measurement

Ø  Non-destructive measurement and inspection

Ø  Ultra-low frequency noise measurement

Ø  Device reliability test

Ø  Device ultrashort pulse test

Accessories

Capacitance test module

Contact: Yanyun Liu

Tel. : 65883196

E-mail: yyliu1@suda.edu.cn


Editor: Wenchang Zhu

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