Presenter: FrankSchreiber, Institut fuer Angewandte Physik, UniversitaetTuebingen, 72076 Tuebingen, Germany
Topic: X-Ray Scattering fromThin Films and Surfaces: Fundamentals and Practical Applications
Time: 10:00 AM, Sept. 29th
Location: Conference Room B, BLDG 909-1F
Abstract:
X-ray scattering is the traditionally the mostsuccessful method for structure determination, from inorganic materials to molecular systems toproteins. The conventionalapplication is frequently considered to be associated with bulk materials, butof course there are many ways X-ray scattering can be employed to characterizethin films and surfaces or other forms of nano-materials. Thepresentation will explain the fundamentals of X-ray scattering from thin filmsand surfaces. After explaining the concept of grazing-incidencescattering and the associated surface-sensitivity we will discuss differentspecific applications, namely:
- X-ray reflectivity (XRR)
- grazing-incidence X-ray diffraction (GIXD)
- grazing-incidence small-angle X-ray scattering (GISAXS)
- nano-diffraction from nano-particles
For each technique, we will discuss practicalapplications to thin films, surfaces, and other nano-materials.
Biography:
- 1987 � 1992 undergraduate studies in physics at Bochum University
- 1992 Diploma (with distinction)
- 1995 Dr. rer. nat. (with distinction) at Bochum University
- 1995/1996 Research in Paris and Prague
- 1996-1997 Post-Doctoral Fellow at Princeton University
- 1998-2002 Research Assistant in Stuttgart (University and MPI-MF)
- 2002 Habilitation in Stuttgart
- 2002 - 2004 University Lecturer at the University of Oxford and Fellow of Wadham College
- since December 2004 Professor (Chair) at Tübingen University
Contact：Prof. Steffen Duhm
(责任编辑：张伶 邮箱：zhangling10@suda.edu.cn)