Prof. Lanza's Work Published in Nature Electronics

time:2019-06-19Hits:171设置

Prof. Mario Lanza’s group has published a visionary perspective paper titled as “Scanning probe microscopy for advanced nanoelectronics” in Nature Electronics, in which he analyzes the future of scanning probe microscopy (SPM) for nanoelectronics research.

The article has immediately attracted widespread attention among experts in the field. The first author is Dr. Fei Hui, who graduated as a Ph.D. student from FUNSOM in 2018, and now is a postdoctoral fellow at the Israel Institute of Technology. According to Prof. Lanza, “Dr. Fei Hui is the most skilled SPM researcher I have ever seen. She has an extraordinary ability to tune all the parameters involved in the measurement, and this has allowed her to detect nanoelectronic behaviors that other scientists were unable to observe. I have no doubt that Dr. Fei Hui will be the next great Chinese expert on SPM-based nanoelectronic characterization”.  

Currently, Prof. Lanza and his students are collaborating with different SPM manufacturers in order to enhance the capabilities of SPMs. In this article, Dr. Fei Hui and Prof. Mario Lanza foresee an SPM setup that could perform both nano-fabrication and nano-characterization simultaneously by combining different types of nanoprobes in a vacuum atmosphere (see image below).

The article scan be read free of charge here: https://rdcu.be/bG4oz

This article has been also highlighted by Nature Electronics in one editorial dedicated to cutting-edge metrology and instrumentation for nanoelectronic research: https://www.nature.com/articles/s41928-019-0269-3.

Prof. Mario Lanza has engaged in SPM-based nanoelectronics research for a long-term, with experimental experience in England, Germany, USA, Spain and China. He has used 20 different SPM machines working in different environments, and published a book named as “Conductive Atomic Force Microscopy: Applications in Nanomaterials”, summarizing the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.

  

Link to Prof. Lanza’s group: http://funsom.suda.edu.cn/funsomen/c4/00/c3002a50176/page.htm

Editor: Danting Xiang

返回原图
/