廖良生教授课题组及其合作者在ACS Energy Lett.上发表论文

题目：

Overcoming Degradation Pathways to Achieve Stable Blue Perovskite Light-Emitting Diodes

作者：

Shuai Yuan^{1, 2}, Xiaopeng Zheng^3,5, Wan-Shan Shen¹, Jiakai Liu³, Lin-Song Cui^2, *, Congcong Zhang¹, Qi-Sheng Tian¹, Jun-Jie Wu¹, Yu-Hang Zhou¹, Xue-Dong Wang¹, Zhao-Kui Wang¹, Pei-gang Han⁴, Joseph M. Luther⁵, Osman M. Bakr^3, * and Liang-Sheng Liao^1,*

单位：

¹Jiangsu Key Laboratory for Carbon-Based Functional Materials & Devices, Institute of Functional Nano & Soft Materials (FUNSOM), Soochow University, Suzhou, Jiangsu 215123, People’s Republic of China.

²Department of Polymer Science and Engineering, University of Science and Technology of China, Hefei, Anhui 230026, China.

³Division of Physical Sciences and Engineering, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Saudi Arabia.

⁴College of New Materials and New Energies, Shenzhen Technology University, Shenzhen 518118, China.

⁵National Renewable Energy Laboratory, Golden, Colorado 80401, United States.

摘要：

Mixed halide (Br/Cl) perovskite nanocrystals (NCs) that represent an advanced blue emitter commonly suffer from spectral instability and poor lifespan; notably, the lack of understanding of the failure mechanisms of these devices has restricted the future progress. Here, we determine that the degradation of CsPbBr_xCl_3–x NCs containing blue light-emitting diodes (LEDs) is due to the combination of two effects. Cl^– drift among adjoining NCs under an electric field is found to induce a Cl-deficient material region in multiple NC layers, which dominates the unstable electroluminescence and causes fast degradation in the corresponding devices. In comparison, the monolayer NC devices that feature restricted anion drift pathways exhibit better operational stability; however, excess hole injection is demonstrated to induce irreversible chlorine loss in NCs. Such a process that largely arises from electrochemical oxidation of Cl^– initiates a mild device failure in operation of tens of minutes. Through revealing these mechanisms, we modulate the devices’ construction and operational conditions to achieve a longer lifespan.

影响因子：

23.101

分区情况：

一区

链接：

https://pubs.acs.org/doi/10.1021/acsenergylett.2c00465