Presenter：Dr. Jian Wang （SM Beamline, Canadian Light Source）
Topic：Synchrotron Soft X-ray Spectromicroscopy and Applications in Materials Research
Time：10:00 AM, October 16th (Friday)
Location：909-B
Abstract:
The soft X-ray spectromicroscopy (SM) beamline at the Canadian Light Source (CLS) synchrotron consists of two X-ray microscopes, i.e., bulk-sensitive Scanning Transmission X-ray Microscope (STXM), including Ambient-STXM and Cryo-STXM, and surface-sensitive X-ray Photoemission Electron Microscope (X-PEEM). These X-ray microscopes are well-suited for the analysis of a wide range of hard and soft materials for quantitative determination of chemical components, electronic and morphological structures in 2D/3D and in bulk/surface using X-ray Absorption Near Edge Structure (XANES) based spectromicroscopy. In this presentation, the technical aspects of the beamline and experimental techniques will be discussed. Selected applications in materials research, particularly characterizations of advanced nanomaterials, systems, and battery materials, as well as in situ studies, using both STXM and X-PEEM, will be presented.
Biography：
Dr. Jian Wang is a Senior Scientist, SM Beamline Responsible, at the Canadian Light Source (CLS), and an Adjunct Professor of Chemistry with the University of Saskatchewan. He received his B.Sc. in Chemistry from Nanjing Normal University in 1996, M.Sc. In Physical Chemistry from Nanjing University in 1999, and Ph.D. in Physical Chemistry from McMaster University in 2008. After the postdoctoral work resident at the Advanced Light Source, he joined the CLS in 2009. He was a Research Associate or Acting Beamline Scientist until 2015, when he was promoted to the Beamline Responsible Scientist. Since 2021, he has been a Senior Scientist at CLS. His current research interests include materials analysis (energy, environmental, catalytic, and magnetic materials) and instrumentation developments for STXM, Ptychography, and XPEEM, with over 250 peer-reviewed publications (citations > 20000, H-index 62).
Contact：Prof. Zhao Feipeng